Scanning Electron Microscope
 |
Proposal(Please use the CGMH internet) |
| Publications | |
| Instrument Manager | |
| Name：Hui-Chun Kung | |
| Ya-Ling Chen | |
| Shih-Hsin Hsiao | |
| Number：(03)32812003#7708 | |
| 1. | Technical princible | ||||
| 2. | Facility Specification | ||||
| I. | Type：Field Emission Scanning Electron Microscopy（FE-SEM） | ||||
| II. | Make：Hitachi SU8220 | ||||
| III. | Accelerating voltage 30 KV | ||||
| IV. | Magnification：30~500, 000X | ||||
| IV. | Attachment： | ||||
| i. | EMAX-Energy HORIBA X-max | ||||
| ii. | Critical point dryer Hitachi HCP-2 | ||||
| iii. | Ion coater Eiko IB-3 | ||||