Scanning Electron Microscope
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Proposal(Please use the CGMH internet) |
| Publications | |
| Instrument Manager | |
| Name：Ms.Gong | |
| Ms.Chen | |
| Ms.Xiao | |
| Number：(03)32812003#7708 | |
| 1. | Technical princible | ||||
| 2. | Facility Specification | ||||
| I. | Type：Field Emission Scanning Electron Microscopy（FE-SEM） | ||||
| II. | Make：Hitachi SU8220 | ||||
| III. | Accelerating voltage 30 KV | ||||
| IV. | Magnification：30~500, 000X | ||||
| IV. | Attachment： | ||||
| i. | EMAX-Energy HORIBA X-max | ||||
| ii. | Critical point dryer Hitachi HCP-2 | ||||
| iii. | Ion coater Eiko IB-3 | ||||